Embedded mechatronic systems. / Volume 2, Analysis of by Abdelkhalak El Hami, Philippe Pougnet

By Abdelkhalak El Hami, Philippe Pougnet

In operation, mechatronics embedded structures are under pressure by means of a great deal of assorted reasons: weather (temperature, humidity), vibration, electric and electromagnetic. those stresses in elements set off failure mechanisms will be pointed out and modeled for higher regulate. AUDACE is a collaborative venture of the cluster Mov'eo that deal with matters particular to mechatronic reliability embedded structures. AUDACE ability reading the explanations of failure of elements of mechatronic platforms onboard. The target of the venture is to optimize the layout of mechatronic units by way of reliability.

The undertaking brings jointly public zone laboratories that experience services in research and modeling of failure, significant teams of mechatronics (Valeo and Thales) within the automobile and aerospace and small and medium firms that experience abilities in characterization and validation tests.

This publication may also help you to:

  • Find and increase how one can symbolize and validate the layout robustness and reliability of complicated mechatronic devices
  • Develop how you can symbolize actual and chemical phenomena,
  • Identify mechanisms of failure of parts of those devices,
  • Analyze the actual and / or chemical mechanisms of failure, so as of importance
  • To version failure mechanisms and layout optimization.

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Embedded mechatronic systems. / Volume 2, Analysis of failures, modeling, simulation and optimization

In operation, mechatronics embedded platforms are under pressure via a great deal of diversified explanations: weather (temperature, humidity), vibration, electric and electromagnetic. those stresses in elements set off failure mechanisms will be pointed out and modeled for larger regulate. AUDACE is a collaborative undertaking of the cluster Mov'eo that deal with concerns particular to mechatronic reliability embedded structures.

Additional info for Embedded mechatronic systems. / Volume 2, Analysis of failures, modeling, simulation and optimization

Sample text

2. 1. ) and on the environmental conditions (temperature, humidity and vibrations). As the test equipment is designed and built to study the aging process of power transistors, the stresses that are applied reflect the operational Aging Power Transistors in Operational Conditions 25 conditions and the electrical and thermal parameters are recorded automatically. g. ); – radiofrequency characterization of the components before and after aging; – equipment integration and reasonable dimension. The workbench records the suitable electrical parameters of the behavior of the power transistor in real operation conditions.

6. Static I-V characteristic in pulsed mode for an LDMOS 300 W transistor subjected to different temperatures. 4. Description of the in situ S-pulsed parameters measures The measurement of pulsed S-parameters can be done on only one sub-unit of the workbench. Technical integration of a vector platform network analyzer (PNA) requires using appropriate couplers. The specific setup developed for this measurement prevents disassembling the RF bench cables. 7 illustrates the principle of the measurement.

Zip 38 Embedded Mechatronic Systems 2 The analysis of the I-V characteristics shows an offset value of the threshold voltage denoted as VTH during aging. The current under the threshold increases during aging especially as the drain voltage Vds is important. However, these changes are not sufficient to generate a change in the transconductance Gm. Despite the evolution of the current Ids, RF performances of the CUT remain stable. This is explained by the fact that the small change in Ids induced a small displacement of the operating point on the I-V characteristic.

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